The R&S RTS radar test solution, featuring the R&S AREG800A automotive radar echo generator and the R&S QAT100 antenna millimeter-wave front-end, was used to validate the new sensor reference design based on NXP's 28nm RFCMOS radar single-chip SoC (SAF85xx). This test for next-generation automotive radar applications contributes to the vision of fully autonomous driving in the automotive industry.

NXP's next-generation automotive radar sensor reference design, based on the industry's first 28nm RFCMOS radar single-chip SoC series, caters to short, medium, and long-range radar applications. It meets challenging NCAP (New Car Assessment Program) safety requirements and demands for L2+ and L3 vehicle comfort features, such as cruise control.

The R&S RTS system, suitable for comprehensive radar sensor characteristic testing, includes a radar echo generator capable of reducing target distances to the airgap of the radar under test. The solution, adaptable for the full lifecycle of automotive radar, includes development labs, hardware-in-the-loop (HIL), vehicle-in-the-loop (VIL), validation, and production applications. It's fully scalable, simulating complex traffic scenarios for advanced driver assistance systems.

Adi Baumann, Senior Director of Advanced Driver Assistance Systems R&D at NXP Semiconductors, commended the long-term collaboration with R&S, highlighting their leading automotive radar test systems that enable high-quality, efficient validation of NXP's automotive radar products.

Gerald Tietscher, Vice President of Signal Sources, Power Supplies, and General Purpose Instruments at R&S, noted the collaboration's role in accelerating the deployment of advanced automotive radar sensors based on 28nm automotive radar chips. These technologies cater to increasingly challenging NCAP safety requirements and will aid in realizing new safety applications.